Dr. Jong U. Kim
at Texas A&M Univ
SPIE Involvement:
Author
Publications (6)

PROCEEDINGS ARTICLE | May 23, 2005
Proc. SPIE. 5844, Noise in Devices and Circuits III
KEYWORDS: Electron beam lithography, Microfluidics, Polymethylmethacrylate, Sensors, Molecules, Ions, Field effect transistors, Signal detection, Solid state electronics, Bacteria

PROCEEDINGS ARTICLE | May 23, 2005
Proc. SPIE. 5846, Noise and Information in Nanoelectronics, Sensors, and Standards III
KEYWORDS: Mirrors, Injuries, Sensors, Ions, Diffusion, Physics, Linear filtering, Clouds, Biology, Bacteria

PROCEEDINGS ARTICLE | May 23, 2005
Proc. SPIE. 5841, Fluctuations and Noise in Biological, Biophysical, and Biomedical Systems III
KEYWORDS: Molecular bridges, Ions, Diagnostics, Amplifiers, Pathogens, Adsorption, Bridges, Field effect transistors, Stochastic processes, Bacteria

PROCEEDINGS ARTICLE | May 23, 2005
Proc. SPIE. 5846, Noise and Information in Nanoelectronics, Sensors, and Standards III
KEYWORDS: Homeland security, Warfare, Biometrics, Statistical analysis, Sensors, Pattern recognition, Forensic science, Biological and chemical sensing, Electrical engineering, Stochastic processes

PROCEEDINGS ARTICLE | May 25, 2004
Proc. SPIE. 5472, Noise and Information in Nanoelectronics, Sensors, and Standards II
KEYWORDS: Logic, Clocks, Error analysis, Interference (communication), Signal processing, Solids, Transistors, Chemical elements, Nanoelectronics, Stochastic processes

PROCEEDINGS ARTICLE | May 8, 2003
Proc. SPIE. 5115, Noise and Information in Nanoelectronics, Sensors, and Standards
KEYWORDS: Clocks, Sensors, Silicon, Resistance, Quantum dots, Capacitance, Quantization, Solids, Transistors, Nanoelectronics

Showing 5 of 6 publications
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