Dr. Jonghan Jin
Principal Research Scientist / Professor at Korea Research Institute of Standards and Science
SPIE Involvement:
Conference Program Committee | Author
Publications (11)

Proceedings Article | 21 June 2019
Proc. SPIE. 11056, Optical Measurement Systems for Industrial Inspection XI
KEYWORDS: Mathematical modeling, Refractive index, Light sources, Interferometers, Glasses, Error analysis, Inspection, Optical interferometry, Motion measurement, Motion analysis

Proceedings Article | 21 June 2019
Proc. SPIE. 11056, Optical Measurement Systems for Industrial Inspection XI
KEYWORDS: Refractive index, Microfluidics, Interferometers, Silicon, Optical testing, Profilometers, Optical interferometry, Semiconducting wafers

Proceedings Article | 28 May 2014
Proc. SPIE. 9110, Dimensional Optical Metrology and Inspection for Practical Applications III
KEYWORDS: Packaging, Wafer-level optics, Semiconductors, Light sources, Metrology, Interferometers, Spectroscopy, Silicon, Geometrical optics, Semiconducting wafers

Proceedings Article | 5 June 2013
Proc. SPIE. 8706, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXIV
KEYWORDS: Wafer-level optics, Refractive index, Light sources, Femtosecond phenomena, Spectroscopy, Silicon, Fourier transforms, Geometrical optics, Semiconducting wafers, Pulsed laser operation

Proceedings Article | 5 June 2013
Proc. SPIE. 8706, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXIV
KEYWORDS: Wafer-level optics, Refractive index, Light sources, Femtosecond phenomena, Silicon, Reliability, Semiconductor lasers, Phase measurement, Semiconducting wafers, Pulsed laser operation

Showing 5 of 11 publications
Conference Committee Involvement (1)
Optical Manufacturing and Testing XIII
25 August 2020 | Online Only, California, United States
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