Dr. Jonghan Jin
Principal Research Scientist at Korea Research Institute of Standards and Science
SPIE Involvement:
Author
Publications (9)

PROCEEDINGS ARTICLE | May 28, 2014
Proc. SPIE. 9110, Dimensional Optical Metrology and Inspection for Practical Applications III
KEYWORDS: Packaging, Wafer-level optics, Semiconductors, Light sources, Metrology, Interferometers, Spectroscopy, Silicon, Geometrical optics, Semiconducting wafers

PROCEEDINGS ARTICLE | June 5, 2013
Proc. SPIE. 8706, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXIV
KEYWORDS: Wafer-level optics, Refractive index, Light sources, Femtosecond phenomena, Silicon, Reliability, Semiconductor lasers, Phase measurement, Semiconducting wafers, Pulsed laser operation

PROCEEDINGS ARTICLE | June 5, 2013
Proc. SPIE. 8706, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXIV
KEYWORDS: Wafer-level optics, Refractive index, Light sources, Femtosecond phenomena, Spectroscopy, Silicon, Fourier transforms, Geometrical optics, Semiconducting wafers, Pulsed laser operation

PROCEEDINGS ARTICLE | May 14, 2012
Proc. SPIE. 8379, Laser Radar Technology and Applications XVII
KEYWORDS: Light sources, Avalanche photodetectors, LIDAR, Sensors, Photodiodes, Time metrology, Distance measurement, Avalanche photodiodes, Signal detection, Standards development

PROCEEDINGS ARTICLE | May 14, 2010
Proc. SPIE. 7718, Optical Micro- and Nanometrology III
KEYWORDS: Optical components, Microscopes, Monochromatic aberrations, Point spread functions, Sensors, Calibration, Computer simulations, 3D metrology, Cylindrical lenses, Cerium

PROCEEDINGS ARTICLE | September 3, 2009
Proc. SPIE. 7394, Plasmonics: Metallic Nanostructures and Their Optical Properties VII
KEYWORDS: Nanostructures, Surface plasmons, Femtosecond phenomena, Finite-difference time-domain method, Metals, Extreme ultraviolet, High harmonic generation, Electronic filtering, Signal detection, Nanolithography

Showing 5 of 9 publications
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