Joonho You
at KAIST
SPIE Involvement:
Author
Publications (4)

Proceedings Article | 10 September 2009
Proc. SPIE. 7432, Optical Inspection and Metrology for Non-Optics Industries
KEYWORDS: Mirrors, Phase shifting, Ferroelectric materials, Detection and tracking algorithms, Interferometers, Error analysis, Wavefronts, Single mode fibers, Phase measurement, Spherical lenses

Proceedings Article | 11 August 2008
Proc. SPIE. 7063, Interferometry XIV: Techniques and Analysis
KEYWORDS: Thin films, Optical filters, Metrology, Data modeling, Polarization, Interfaces, Reflectivity, Reflectometry, Objectives, Light

Proceedings Article | 14 September 2007
Proc. SPIE. 6674, Thin-Film Coatings for Optical Applications IV
KEYWORDS: Semiconductors, Thin films, Optical filters, Refractive index, Mirrors, Silicon, Inspection, Interferometry, 3D displays, Chemical mechanical planarization

Proceedings Article | 18 June 2007
Proc. SPIE. 6616, Optical Measurement Systems for Industrial Inspection V
KEYWORDS: Thin films, Metrology, 3D acquisition, Data modeling, Spectroscopy, Inspection, Interferometry, 3D metrology, Charge-coupled devices, Phase measurement

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