In this work, we propose an alternative to the sub-sampling limitation in the single-waveguide configuration of SWIFTS technology using the electro-optical properties of Lithium Niobate (LiNbO<sub>3</sub>) technology. A Mach-Zehnder intensity modulator, with an initial imbalance between the arms, is coupled with a linear SWIFTS-Lippmann spectrometer. With quite reasonable control voltages (<100V), "dynamic" wide band fringes (generated by the unbalanced interferometer) can be moved under the nanodots to compensate the sub-sampling related to their spacing and rebuild the interferogram with a good sampling in a very short time, thanks to the electro-optical performances of Lithium Niobate technology. We present the measurements of broadband sources' interferograms sampled by this setup, and the considerations for spectral reconstructions for a SLED source at λ = 850 nm. The study leads to a better understanding of the behavior of the spectrometer with model and local measurement of the cross-talk phenomenon between nanodots and pixels, photometries and efficiencies of diffusion. This work opens the way to electro-optic devices where external optical path delay scan could be replaced by internal phase-modulation using electro-optic effect.