Dr. Joerg Bischoff
CEO at OSIRES
SPIE Involvement:
Conference Program Committee | Author
Area of Expertise:
Optical Design , Diffractive Optics , Electromagnetic Modeling , Optical Scatterometry , Optical Lithography , Astronomical Instrumentation
Websites:
Conference Committee Involvement (8)
Modeling Aspects in Optical Metrology VIII
21 June 2021 | Online Only, Germany
Modeling Aspects in Optical Metrology VII
24 June 2019 | Munich, Germany
Modeling Aspects in Optical Metrology
26 June 2017 | Munich, Germany
Modeling Aspects in Optical Metrology V
23 June 2015 | Munich, Germany
Modeling Aspects in Optical Metrology IV
13 May 2013 | Munich, Germany
Showing 5 of 8 Conference Committees
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top