Prof. Jörg Seewig
Full Professor at Technische Univ Kaiserslautern
SPIE Involvement:
Conference Program Committee | Author
Publications (12)

PROCEEDINGS ARTICLE | September 7, 2018
Proc. SPIE. 10834, Speckle 2018: VII International Conference on Speckle Metrology
KEYWORDS: Confocal microscopy, Holograms, Digital holography, Interferometers, Sensors, Surface roughness, Deconvolution

PROCEEDINGS ARTICLE | May 29, 2018
Proc. SPIE. 10675, 3D Printed Optics and Additive Photonic Manufacturing
KEYWORDS: Lithography, Metrology, Calibration, Etching, Coating, Manufacturing, Laser applications, Optics manufacturing, Standards development, Multiphoton lithography

PROCEEDINGS ARTICLE | February 22, 2018
Proc. SPIE. 10544, Advanced Fabrication Technologies for Micro/Nano Optics and Photonics XI
KEYWORDS: Lithography, Point spread functions, Calibration, Additive manufacturing, Polymerization, Standards development

PROCEEDINGS ARTICLE | July 14, 2017
Proc. SPIE. 10329, Optical Measurement Systems for Industrial Inspection X
KEYWORDS: Oxides, Ellipsometry, Refractive index, Multilayers, Polarization, Optical properties, Graphics processing units, Silicon, Optical coatings, Phase shift keying, Aluminum, Electromagnetism, Statistical modeling, Oxidation

PROCEEDINGS ARTICLE | June 13, 2017
Proc. SPIE. 10449, Fifth International Conference on Optical and Photonics Engineering
KEYWORDS: Optical components, Metrology, Calibration, Etching, Manufacturing, Additive manufacturing, Measurement devices, Geometrical optics, Optics manufacturing, Standards development

PROCEEDINGS ARTICLE | June 22, 2015
Proc. SPIE. 9525, Optical Measurement Systems for Industrial Inspection IX
KEYWORDS: Confocal microscopy, Curium, Interferometers, Calibration, Manufacturing, Chromium, Optical testing, Signal processing, Measurement devices, Optics manufacturing

Showing 5 of 12 publications
Conference Committee Involvement (4)
Optical Measurement Systems for Industrial Inspection X
26 June 2017 | Munich, Germany
Optical Measurement Systems for Industrial Inspection VIII
13 May 2013 | Munich, Germany
Optical Measurement Systems for Industrial Inspection
23 May 2011 | Munich, Germany
Optical Measurement Systems for Industrial Inspection
16 June 2009 | Munich, Germany
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