Dr. Jorge A. Huerta-Ruelas
at Instituto Politécnico Nacional
SPIE Involvement:
Author
Publications (8)

PROCEEDINGS ARTICLE | October 15, 2011
Proc. SPIE. 8287, Eighth Symposium Optics in Industry
KEYWORDS: Optical fibers, Metrology, Modulation, Calibration, Dispersion, Phase shift keying, Optical testing, Telecommunications, Picosecond phenomena, Network security

PROCEEDINGS ARTICLE | December 4, 2009
Proc. SPIE. 7499, Seventh Symposium Optics in Industry
KEYWORDS: Photodetectors, Sensors, Light scattering, Inspection, Laser scattering, Amplifiers, Data acquisition, Optical metrology, Signal processing, Scatter measurement

PROCEEDINGS ARTICLE | December 4, 2009
Proc. SPIE. 7499, Seventh Symposium Optics in Industry
KEYWORDS: Optical signal processing, Scattering, Sensors, Calcium, Light scattering, Photodiodes, Detector arrays, Signal processing, Scatter measurement, Temperature metrology

PROCEEDINGS ARTICLE | December 4, 2009
Proc. SPIE. 7499, Seventh Symposium Optics in Industry
KEYWORDS: Semiconductors, Composites, Semiconductor materials, Reflectivity, Optical testing, Data acquisition, Signal processing, Finite element methods, Semiconducting wafers, Heterojunctions

PROCEEDINGS ARTICLE | May 19, 2007
Proc. SPIE. 6422, Sixth Symposium Optics in Industry
KEYWORDS: Carbon, Proteins, Biomedical optics, Chemical species, Electrodes, Resistance, Optical testing, Signal processing, Optical activity, Temperature metrology

PROCEEDINGS ARTICLE | May 18, 2007
Proc. SPIE. 6422, Sixth Symposium Optics in Industry
KEYWORDS: Modulation, Optical properties, Glasses, Molecules, Laser scattering, Optical testing, Signal processing, Laser beam diagnostics, Signal detection, Temperature metrology

Showing 5 of 8 publications
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