CONFERENCE PROCEEDINGS
Advanced Search
Dr. Jorge R. Parra Michel
at Universidad De La Salle Bajío
SPIE Involvement:
Author
Area of Expertise:
interferometry , strees analysis , moiré , ESPI , deformation measurement , holography
Websites:
Company Website
Publications (1)
Proceedings Article | 10 September 2009 Paper
Computation of crack tip elastic strain intensity factor in mode I by electronic speckle pattern interferometry
Proceedings Volume 7432, 74321B (2009) https://doi.org/10.1117/12.824393
KEYWORDS: Finite element methods, Interferometry, Speckle pattern, Mechanics, Speckle, Failure analysis, Image processing, Resistance, Manufacturing, Phase shift keying
SIGN IN TO:
  • View contact details
UPDATE YOUR PROFILE
Is this your profile? Update it now.
Sign into your SPIE.org account
Don’t have a profile and want one?
Create an account on SPIE.org
Advertisement
Advertisement
Back to Top