Dr. Jorge Piris
Optoelectronics Engineer at European Space Research and Technology Ctr
SPIE Involvement:
Author
Publications (5)

Proceedings Article | 17 November 2017
Proc. SPIE. 10563, International Conference on Space Optics — ICSO 2014
KEYWORDS: Contamination, High power lasers, Nitrogen, Reliability, Oxygen, Semiconductor lasers, Diodes, Astronomical imaging, Space operations, Single crystal X-ray diffraction

Proceedings Article | 17 November 2017
Proc. SPIE. 10563, International Conference on Space Optics — ICSO 2014
KEYWORDS: Polarization, Sensors, Manufacturing, Semiconductor lasers, Diodes, Vertical cavity surface emitting lasers, Astronomical imaging, Laser manufacturing, Magnetometers, Optics manufacturing

Proceedings Article | 6 December 2016
Proc. SPIE. 10014, Laser-Induced Damage in Optical Materials 2016
KEYWORDS: Microscopy, Particles, Copper, Ceramics, Inspection, Scanning electron microscopy, Laser ablation, Aluminum, Laser damage threshold, Silicon carbide

Proceedings Article | 4 November 2014
Proc. SPIE. 9237, Laser-Induced Damage in Optical Materials: 2014
KEYWORDS: Aerospace engineering, Laser induced damage, Silicon, Nd:YAG lasers, Optical testing, Data acquisition, Diodes, Damage detection, Laser damage threshold, Semiconducting wafers

Proceedings Article | 14 November 2013
Proc. SPIE. 8885, Laser-Induced Damage in Optical Materials: 2013
KEYWORDS: Laser sources, Mirrors, Antireflective coatings, Data modeling, Laser induced damage, Error analysis, Coating, Optical testing, Laser damage threshold, Standards development

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