Dr. J. Carlos López-Vázquez
Associate Professor at Univ de Vigo
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Publications (32)

Proceedings Article | 7 September 2018 Paper
Ángel Doval, Cristina Trillo, José Carlos López-Vázquez, José Fernández
Proceedings Volume 10834, 1083408 (2018) https://doi.org/10.1117/12.2318661
KEYWORDS: Holograms, Digital holography, Monte Carlo methods, Fourier transforms, Cameras, Holography, Imaging systems, Phase measurement, Holographic interferometry, Uncertainty analysis, Optical metrology, Speckle metrology

Proceedings Article | 7 September 2018 Paper
Proceedings Volume 10834, 1083416 (2018) https://doi.org/10.1117/12.2318604
KEYWORDS: Scattering, Error analysis, Wave plates, Finite element methods, Acoustics, Wave propagation, Quantitative analysis, Visualization, Holography, Speckle

SPIE Journal Paper | 30 June 2016
Ángel F. Doval, Cristina Trillo, J. Carlos López-Vázquez, José Fernández
OE, Vol. 55, Issue 12, 121709, (June 2016) https://doi.org/10.1117/12.10.1117/1.OE.55.12.121709
KEYWORDS: Digital holography, Holograms, Holographic interferometry, Fourier transforms, Cameras, Phase measurement, Optical engineering, Holography, 3D image reconstruction, Statistical analysis

Proceedings Article | 24 August 2015 Paper
Ángel Doval, Cristina Trillo, José Carlos López Vázquez, José Fernández
Proceedings Volume 9660, 966007 (2015) https://doi.org/10.1117/12.2196205
KEYWORDS: Holograms, Digital holography, Holographic interferometry, Phase measurement, Fourier transforms, Holography, Bismuth, Statistical analysis, Cameras, Calibration

SPIE Journal Paper | 20 August 2013 Open Access
OE, Vol. 52, Issue 10, 101901, (August 2013) https://doi.org/10.1117/12.10.1117/1.OE.52.10.101901
KEYWORDS: Speckle metrology, Speckle, Digital holography, Optical engineering, Applied physics, Interferometry, Nondestructive evaluation, Electronics engineering, Optical metrology, Speckle pattern

Showing 5 of 32 publications
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