Dr. José María Enguita González Profile

Dr. José María Enguita González

Associate Professor at Univ de Oviedo

SPIE Involvement:

Author

Area of Expertise:

Industrial Inspection , Optical Measurement Sytems , Profilometry , Conoscopic Holography

Profile Summary

José María Enguita received the MS degree in computer science and the Ph.D. from the University of Oviedo, Spain,in 1997 and 2003 respectively. He has been working as a Teaching Assistant & later as associate Professor in the University of Oviedo since 1999, teaching courses in computer networks, process control, industrial inspection and automation. His research interests include simulation, nondestructive inspection, computer vision, and conoscopic holography.

Publications (15)

Proceedings Article | 24 May 2013 Paper

Paper

Automatic area based registration method and its application to the surface inspection of steel industry products

Ricardo García Llenderrozos, Ignacio Álvarez García, José Enguita González, Silvia Rodríguez Jiménez

Proceedings Volume 8791, 87911I (2013) https://doi.org/10.1117/12.2020543

KEYWORDS: Video, Inspection, Image processing, Image registration, Cameras, Statistical analysis, Sensors, Defect detection, Motion estimation, Electroluminescent displays

Read Abstract +

Proceedings Article | 27 May 2011 Paper

Paper

Fringe pattern characterization by OPD analysis in a lateral shearing interferometric profilometer

María Frade, José María Enguita, Ignacio Álvarez, Silvia Rodríguez-Jiménez

Proceedings Volume 8082, 80821S (2011) https://doi.org/10.1117/12.889267

KEYWORDS: Fringe analysis, Wavefronts, Profilometers, Interferometry, Speckle, Defect detection, Crystals, Charge-coupled devices, Inspection, Calibration

Read Abstract +

SPIE Journal Paper | 1 February 2010

Common-path two-wavelength interferometer with submicron precision for profile measurements in on-line applications

José Maria Enguita, Ignacio Álvarez, María Frade Rodriguez, Jorge Marina

OE, Vol. 49, Issue 02, 023602, (February 2010) https://doi.org/10.1117/12.10.1117/1.3321709

KEYWORDS: Interferometers, Precision measurement, Fourier transforms, Interferometry, Prototyping, Diffusers, Speckle, Optical engineering, Inspection, Fringe analysis

Read Abstract +

Proceedings Article | 17 June 2009 Paper

Paper

Industrial online surface defects detection in continuous casting hot slabs

Ignacio Alvarez, Jorge Marina, Jose Maria Enguita, Cesar Fraga, Ricardo Garcia

Proceedings Volume 7389, 73891X (2009) https://doi.org/10.1117/12.827532

KEYWORDS: Sensors, Inspection, Defect detection, Signal to noise ratio, Profilometers, Charge-coupled devices, Holography, CCD image sensors, Interferometry, Signal detection

Read Abstract +

Proceedings Article | 17 June 2009 Paper

Paper

Common-path two-wavelength interferometer with submicron precision for profile measurements in online applications

José Enguita, Ignacio Álvarez, María Frade, Jorge Marina

Proceedings Volume 7389, 73890W (2009) https://doi.org/10.1117/12.827502

KEYWORDS: Interferometry, Fourier transforms, Prototyping, Interferometers, Diffusers, Inspection, Speckle, Fringe analysis, Precision measurement, Holography

Read Abstract +

Proceedings Article | 18 May 2009 Paper

Paper

Toward extended range sub-micron conoscopic holography profilometers using multiple wavelengths and phase measurement

José Enguita, Ignacio Álvarez, Jorge Marina, Guillermo Ojea, José Cancelas, María Frade

Proceedings Volume 7356, 735617 (2009) https://doi.org/10.1117/12.819456

KEYWORDS: Crystals, Holography, Fringe analysis, Speckle, Inspection, Sensors, Signal processing, Interferometry, Profilometers, Prototyping

Read Abstract +

SPIE Journal Paper | 1 February 2008

On-line submicron profile measurements from safe distances with conoscopic holography: feasibility and potential problems

Ignacio Alvarez, Jose Enguita, Jorge Marina, Cesar Fraga Bobis

OE, Vol. 47, Issue 02, 023602, (February 2008) https://doi.org/10.1117/12.10.1117/1.2844713

KEYWORDS: Speckle, Distance measurement, Holography, Diffusers, Crystals, Sensors, Inspection, Optical engineering, Fringe analysis, Fourier transforms

Read Abstract +

SPIE Journal Paper | 1 September 2007

Improving signal processing performance on a conoscopic holography-based profilometer with phase-shifting interferometry algorithms

Jose Enguita, Ignacio Alvarez, Cesar Fraga Bobis, Jorge Marina, Yolanda Fernández

OE, Vol. 46, Issue 09, 093605, (September 2007) https://doi.org/10.1117/12.10.1117/1.2786862

KEYWORDS: Signal processing, Fringe analysis, Phase shifts, Sensors, Inspection, Holography, Profilometers, Optical engineering, Phase interferometry, Speckle

Read Abstract +

Proceedings Article | 12 October 2006 Paper

Paper

Toward online non-contact roughness profile measurements with a sensor based on conoscopic holography: current developments

Ignacio Álvarez, Jorge Marina, José Enguita, César Fraga, Ricardo García, Guillermo Ojea

Proceedings Volume 6382, 638202 (2006) https://doi.org/10.1117/12.686220

KEYWORDS: Speckle, Holography, Diffusers, Sensors, Fringe analysis, Crystals, Inspection, Profilometers, Light scattering, Charge-coupled devices

Read Abstract +

SPIE Journal Paper | 1 July 2006

Conoscopic holography-based long-standoff profilometer for surface inspection in adverse environment

Jose Enguita, Ignacio Alvarez, Cesar Fraga Bobis, Jorge Marina, Yolanda Fernández, Gabriel Sirat

OE, Vol. 45, Issue 07, 073602, (July 2006) https://doi.org/10.1117/12.10.1117/1.2219097

KEYWORDS: Inspection, Holography, Sensors, Profilometers, Speckle, Optical engineering, Algorithm development, Crystals, Defect detection, Charge-coupled devices

Read Abstract +

Proceedings Article | 22 April 2006 Paper

Paper

Conoscopic holography based profilometers for defect inspection: improviements in speed, resolution, and noise reduction

Ignacio Álvarez, José Enguita, César Fraga, Jorge Marina, Yolanda Fernández

Proceedings Volume 6189, 61890H (2006) https://doi.org/10.1117/12.661455

KEYWORDS: Speckle, Sensors, Fringe analysis, Signal processing, Phase shifts, Holography, Crystals, Profilometers, Inspection, Diffusers

Read Abstract +

Proceedings Article | 13 June 2005 Paper

Paper

A long standoff profilometer for surface inspection in adverse environments based on conoscopic holography

Jose Enguita, Ignacio Alvarez, Cesar Fraga, Jorge Marina, Yolanda Fernandez, Gabriel Sirat

Proceedings Volume 5856, (2005) https://doi.org/10.1117/12.612259

KEYWORDS: Inspection, Sensors, Holography, Fringe analysis, Defect detection, Crystals, Speckle, Computing systems, Profilometers, Signal processing

Read Abstract +

Proceedings Article | 13 June 2005 Paper

Paper

On-line non-contact measuring of synchronizer hubs

Cesar Fraga, Jose Enguita, Ignacio Alvarez, Jorge Marina, Nestor Martinez

Proceedings Volume 5856, (2005) https://doi.org/10.1117/12.612258

KEYWORDS: Sensors, Inspection, Tolerancing, Calibration, Cameras, Control systems, Standards development, Holography, Head, Crystals

Read Abstract +

SPIE Journal Paper | 1 March 2005

Denoising of conoscopic holography fringe patterns with orientational filters: a comparative study

Jose Enguita, Yolanda Fernández, Ignacio Alvarez, Cesar Fraga Bobis, Jorge Marina

OE, Vol. 44, Issue 03, 035603, (March 2005) https://doi.org/10.1117/12.10.1117/1.1872972

KEYWORDS: Fringe analysis, Denoising, Holography, Speckle, Image filtering, Optical filters, Wavelets, Electronic filtering, Sensors, Optical engineering

Read Abstract +

Proceedings Article | 10 September 2004 Paper

Paper

Denoising of conoscopic holography fringe patterns with orientational filters: a comparative study

Jose Enguita, Yolanda Fernandez, Ignacio Alvarez, Cesar Fraga, Jorge Marina

Proceedings Volume 5457, (2004) https://doi.org/10.1117/12.544135

KEYWORDS: Fringe analysis, Denoising, Optical filters, Speckle, Wavelets, Image filtering, Holography, Sensors, Inspection, Electronic filtering

Read Abstract +

Showing 5 of 15 publications

SIGN IN TO:

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Advertisement

Advertisement