Dr. José María Enguita González
Associate Professor at Univ de Oviedo
SPIE Involvement:
Author
Area of Expertise:
Industrial Inspection , Optical Measurement Sytems , Profilometry , Conoscopic Holography
Profile Summary

José María Enguita received the MS degree in computer science and the Ph.D. from the University of Oviedo, Spain,in 1997 and 2003 respectively. He has been working as a Teaching Assistant & later as associate Professor in the University of Oviedo since 1999, teaching courses in computer networks, process control, industrial inspection and automation. His research interests include simulation, nondestructive inspection, computer vision, and conoscopic holography.
Publications (15)

PROCEEDINGS ARTICLE | May 24, 2013
Proc. SPIE. 8791, Videometrics, Range Imaging, and Applications XII; and Automated Visual Inspection
KEYWORDS: Statistical analysis, Defect detection, Cameras, Sensors, Image processing, Video, Inspection, Image registration, Electroluminescent displays, Motion estimation

PROCEEDINGS ARTICLE | May 27, 2011
Proc. SPIE. 8082, Optical Measurement Systems for Industrial Inspection VII
KEYWORDS: Fringe analysis, Defect detection, Speckle, Calibration, Crystals, Inspection, Interferometry, Wavefronts, Profilometers, Charge-coupled devices

SPIE Journal Paper | February 1, 2010
OE Vol. 49 Issue 02
KEYWORDS: Interferometers, Precision measurement, Fourier transforms, Interferometry, Prototyping, Diffusers, Speckle, Optical engineering, Inspection, Fringe analysis

PROCEEDINGS ARTICLE | June 17, 2009
Proc. SPIE. 7389, Optical Measurement Systems for Industrial Inspection VI
KEYWORDS: Fringe analysis, Holography, Speckle, Interferometers, Inspection, Fourier transforms, Interferometry, Precision measurement, Diffusers, Prototyping

PROCEEDINGS ARTICLE | June 17, 2009
Proc. SPIE. 7389, Optical Measurement Systems for Industrial Inspection VI
KEYWORDS: Signal to noise ratio, Holography, Defect detection, Sensors, Inspection, Interferometry, Profilometers, Charge-coupled devices, CCD image sensors, Signal detection

PROCEEDINGS ARTICLE | May 18, 2009
Proc. SPIE. 7356, Optical Sensors 2009
KEYWORDS: Fringe analysis, Holography, Speckle, Sensors, Crystals, Inspection, Interferometry, Signal processing, Profilometers, Prototyping

Showing 5 of 15 publications
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