Prof. Josef Sikula
at Brno Univ of Technology
SPIE Involvement:
Author
Publications (2)

PROCEEDINGS ARTICLE | May 25, 2004
Proc. SPIE. 5470, Noise in Devices and Circuits II
KEYWORDS: Roentgenium, Remote sensing, Resistance, Interference (communication), Capacitance, Measurement devices, Field effect transistors, Resistors

PROCEEDINGS ARTICLE | May 25, 2004
Proc. SPIE. 5472, Noise and Information in Nanoelectronics, Sensors, and Standards II
KEYWORDS: Semiconductors, Oxides, Superposition, Switching, Modulation, Interfaces, Silicon, Quantum dots, Electronic components, Field effect transistors

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