Mr. Joseph G. Bolke Profile

Joseph G. Bolke

at 5N Plus Inc

SPIE Involvement:

Author

Publications (3)

Proceedings Article | 29 September 2017 Presentation + Paper

Measuring Te inclusion uniformity over large areas for CdTe/CZT imaging and spectrometry sensors

Joe Bolke, Kathryn O'Brien, Peter Wall, Mike Spicer, Guillaume Gélinas, Jean-Nicolas Beaudry, W. Brock Alexander

Proceedings Volume 10423, 104231M (2017) https://doi.org/10.1117/12.2278584

KEYWORDS: Crystals, Sensors, Imaging spectroscopy, Spectroscopy, Image sensors, Spectroscopes, Optical sensors, X-ray imaging, X-rays, Astrophysics

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Proceedings Article | 20 May 2016 Paper

Enabling on-axis InSb crystal growth for high-volume wafer production: characterizing and eliminating variation in electrical performance for IR focal plane array applications

Jason Merrell, Nathan Gray, Joseph Bolke, Andrew Merrell, Andrew Prax, Jonathan Demke, Nikolas Gossett

Proceedings Volume 9819, 981915 (2016) https://doi.org/10.1117/12.2223956

KEYWORDS: Crystals, Semiconducting wafers, Staring arrays, Sensors, Interfaces, Antimony, Manufacturing, Crystallography, Tellurium, Supercooling

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Proceedings Article | 20 May 2016 Paper

Rapid development of high-volume manufacturing methods for epi-ready GaSb wafers up to 6” diameter for IR imaging applications

Nathan Gray, Andrew Prax, Daniel Johnson, Jonathan Demke, Joseph Bolke, W. Alexander

Proceedings Volume 9819, 981914 (2016) https://doi.org/10.1117/12.2223998

KEYWORDS: Gallium antimonide, Semiconducting wafers, Crystals, Superlattices, Infrared imaging, X-rays, Antimony, Manufacturing, Wafer manufacturing, Interfaces

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