Dr. Joseph Cohen-Sabban
President at Sciences et Techniques Industrielles de la Lumière
SPIE Involvement:
Author
Publications (4)

Proceedings Article | 11 August 2008
Proc. SPIE. 7064, Interferometry XIV: Applications
KEYWORDS: Microscopes, Sensors, Spectroscopy, Microscopy, Inspection, Interferometry, 3D metrology, Optical interferometry, Fresnel lenses, Visibility

Proceedings Article | 14 August 2006
Proc. SPIE. 6292, Interferometry XIII: Techniques and Analysis
KEYWORDS: Confocal microscopy, Mirrors, Light sources, Imaging systems, Interferometers, Sensors, Glasses, Interferometry, Phase interferometry, Colorimetry

Proceedings Article | 26 February 2004
Proc. SPIE. 5252, Optical Fabrication, Testing, and Metrology
KEYWORDS: Confocal microscopy, Metrology, 3D surface sensing, Imaging systems, Stereoscopy, Optical testing, Colorimetry, 3D metrology, Associative arrays, 3D image processing

Proceedings Article | 10 December 2001
Proc. SPIE. 4449, Optical Metrology Roadmap for the Semiconductor, Optical, and Data Storage Industries II
KEYWORDS: Confocal microscopy, Metrology, Imaging systems, Image segmentation, Optical microscopy, Colorimetry, Optoelectronics, 3D metrology, Associative arrays, 3D image processing

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