Dr. Joseph G. Gordon
Manager at IBM Research - Almaden
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | November 1, 1991
Proc. SPIE. 1550, X Rays in Materials Analysis II: Novel Applications and Recent Developments
KEYWORDS: Diffraction, Modulation, Scattering, Electrodes, Metals, X-rays, Interfaces, Silver, Bismuth, Materials analysis

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