Dr. Joseph T. Kennedy
Product Manager at Honeywell Electronic Materials
SPIE Involvement:
Author
Publications (10)

Proceedings Article | 18 March 2010
Proc. SPIE. 7636, Extreme Ultraviolet (EUV) Lithography
KEYWORDS: Thin films, Interfaces, Photoresist materials, Extreme ultraviolet, Extreme ultraviolet lithography, Head-mounted displays, Line edge roughness, Photoresist processing, 3D image processing, Liquids

Proceedings Article | 11 December 2009
Proc. SPIE. 7520, Lithography Asia 2009
KEYWORDS: Lithography, Optical lithography, Optical properties, Ultraviolet radiation, Silicon, Chemistry, Photoresist materials, Double patterning technology, Semiconducting wafers, Photoresist developing

Proceedings Article | 1 April 2009
Proc. SPIE. 7273, Advances in Resist Materials and Processing Technology XXVI
KEYWORDS: Lithography, Optical lithography, Optical properties, Etching, Silicon, Scanning electron microscopy, Photoresist materials, Line width roughness, Plasma etching, Plasma

Proceedings Article | 1 April 2009
Proc. SPIE. 7273, Advances in Resist Materials and Processing Technology XXVI
KEYWORDS: Lithography, FT-IR spectroscopy, Optical lithography, Optical properties, Ultraviolet radiation, Silicon, Photoresist materials, Double patterning technology, Time division multiplexing, Semiconducting wafers

Proceedings Article | 16 March 2009
Proc. SPIE. 7274, Optical Microlithography XXII
KEYWORDS: Lithography, FT-IR spectroscopy, Optical lithography, Optical properties, Polymers, Dielectrics, Chemistry, Resistance, Photoresist materials, Bottom antireflective coatings

Showing 5 of 10 publications
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