Dr. Joseph D. Laveigne
Technical Director at Santa Barbara Infrared Inc
SPIE Involvement:
Author
Publications (36)

PROCEEDINGS ARTICLE | May 3, 2017
Proc. SPIE. 10178, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXVIII
KEYWORDS: Long wavelength infrared, Mid-IR, Short wave infrared radiation, Visible radiation, Sensors, Calibration, Remote sensing, Reflectivity, Black bodies, Integrating spheres, Sensor fusion, Temperature metrology

PROCEEDINGS ARTICLE | May 3, 2017
Proc. SPIE. 10178, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXVIII
KEYWORDS: Packaging, Infrared detectors, Infrared imaging, Mid-IR, Cameras, Detector arrays, Detector development, Projection systems, Infrared radiation, Integrated circuits, Scene simulation, Hardware in the loop testing, Temperature metrology

PROCEEDINGS ARTICLE | May 3, 2016
Proc. SPIE. 9820, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXVII
KEYWORDS: Packaging, Infrared detectors, Mid-IR, Sensors, Detector development, Projection systems, Infrared radiation, Integrated circuits, Integrated circuit design, Temperature metrology

PROCEEDINGS ARTICLE | May 3, 2016
Proc. SPIE. 9820, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXVII
KEYWORDS: Staring arrays, Staring arrays, Infrared imaging, Mid-IR, Light emitting diodes, Light emitting diodes, Data modeling, Projection systems, Infrared radiation, Infrared radiation, Imaging infrared seeker, Thermal modeling, Systems modeling

PROCEEDINGS ARTICLE | May 12, 2015
Proc. SPIE. 9452, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXVI
KEYWORDS: Thermography, Infrared imaging, Mid-IR, Electronics, Light emitting diodes, Projection systems, Infrared radiation, Digital micromirror devices, Infrared technology, Analog electronics

PROCEEDINGS ARTICLE | May 12, 2015
Proc. SPIE. 9452, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXVI
KEYWORDS: Mid-IR, Etching, Dry etching, Metals, Dielectrics, Silicon, Resistance, Infrared radiation, Resistors, Semiconducting wafers

Showing 5 of 36 publications
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