Prof. Ju-Yi Lee
at National Central Univ
SPIE Involvement:
Author
Publications (14)

SPIE Journal Paper | September 14, 2017
JPE Vol. 7 Issue 03
KEYWORDS: Interfaces, Hydrogen, Doping, Semiconducting wafers, Solar cells, Thin films, Silicon films, Silicon, Amorphous silicon, Heterojunctions

PROCEEDINGS ARTICLE | June 26, 2017
Proc. SPIE. 10329, Optical Measurement Systems for Industrial Inspection X
KEYWORDS: Wafer-level optics, Light sources, Moire patterns, Light emitting diodes, Sensors, Manufacturing, CCD cameras, Collimation, Profiling, Light sources and illumination, Epitaxy, Metalorganic chemical vapor deposition, Semiconducting wafers, Wafer testing, Phase shifts

PROCEEDINGS ARTICLE | June 26, 2017
Proc. SPIE. 10329, Optical Measurement Systems for Industrial Inspection X
KEYWORDS: Photodetectors, Mirrors, Phase modulation, Modulation, Polarization, Interferometers, Sensors, Interferometry, Phase shift keying, Heterodyning, Scanning probe microscopy, Phase measurement, Signal detection, Diffraction gratings

PROCEEDINGS ARTICLE | June 22, 2013
Proc. SPIE. 8769, International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013)
KEYWORDS: Prisms, Holograms, Holography, Interferometers, Sensors, Interferometry, Heterodyning, Position sensors, Volume holography, Diffraction gratings

PROCEEDINGS ARTICLE | September 20, 2011
Proc. SPIE. 8105, Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors V
KEYWORDS: Laser sources, Photodetectors, Beam splitters, Interferometers, Composites, Manufacturing, Computer programming, Laser optics, Environmental sensing, Laser systems engineering

PROCEEDINGS ARTICLE | June 17, 2009
Proc. SPIE. 7389, Optical Measurement Systems for Industrial Inspection VI
KEYWORDS: Light sources, Speckle, Interferometers, Light scattering, Interferometry, Semiconductor lasers, Heterodyning, Speckle interferometry, Signal processing, Phase measurement

Showing 5 of 14 publications
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