Juan A. Cardenas-Franco
at Univ Politécnica de Tulancingo
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 6 March 2013 Paper
Proceedings Volume 8661, 86610Y (2013) https://doi.org/10.1117/12.2008571
KEYWORDS: Inspection, Image filtering, Machine vision, Defect detection, Image processing, Fourier transforms, Image acquisition, Detection and tracking algorithms, Cameras, Light sources

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