Judit Kopniczky
Student at Uppsala Univ
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | May 25, 2004
Proc. SPIE. 5472, Noise and Information in Nanoelectronics, Sensors, and Standards II
KEYWORDS: Oxides, Sensors, Nanoparticles, Annealing, Particles, Crystals, Tungsten, Atomic force microscopy, Aluminum, Temperature metrology

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