Dr. Jukka Iivarinen
Researcher at Aalto Univ School of Science and Technology
SPIE Involvement:
Author
Publications (8)

Proceedings Article | 3 May 2004 Paper
Jukka Iivarinen, Jussi Pakkanen, Juhani Rauhamaa
Proceedings Volume 5303, (2004) https://doi.org/10.1117/12.526617
KEYWORDS: Databases, Inspection, Image segmentation, Defect detection, Image retrieval, Feature extraction, Cameras, Content based image retrieval, Image classification, Classification systems

Proceedings Article | 1 May 2003 Paper
Jussi Pakkanen, Jukka Iivarinen
Proceedings Volume 5132, (2003) https://doi.org/10.1117/12.514962
KEYWORDS: Databases, Inspection, Content based image retrieval, Image retrieval, Feature extraction, Distance measurement, Prototyping, Image filtering, Information science, Image classification

Proceedings Article | 5 October 2001 Paper
Proceedings Volume 4572, (2001) https://doi.org/10.1117/12.444218
KEYWORDS: Image segmentation, Statistical analysis, Feature extraction, Defect detection, Statistical modeling, Error analysis, Inspection, Image processing algorithms and systems, Algorithm development, Distance measurement

Proceedings Article | 11 October 2000 Paper
Proceedings Volume 4197, (2000) https://doi.org/10.1117/12.403757
KEYWORDS: Image segmentation, Defect detection, Binary data, Statistical analysis, Image processing algorithms and systems, Image processing, Feature extraction, Detection and tracking algorithms, Stochastic processes, Inspection

Proceedings Article | 6 October 1998 Paper
Proceedings Volume 3522, (1998) https://doi.org/10.1117/12.325796
KEYWORDS: Image segmentation, Statistical analysis, Defect detection, Prototyping, Feature extraction, Error analysis, Statistical methods, Image classification, Ions, Information technology

Showing 5 of 8 publications
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