Dr. Jukka Iivarinen
Researcher at Aalto Univ School of Science and Technology
SPIE Involvement:
Author
Publications (8)

Proceedings Article | 3 May 2004
Proc. SPIE. 5303, Machine Vision Applications in Industrial Inspection XII
KEYWORDS: Content based image retrieval, Defect detection, Cameras, Databases, Image segmentation, Inspection, Feature extraction, Image retrieval, Image classification, Classification systems

Proceedings Article | 1 May 2003
Proc. SPIE. 5132, Sixth International Conference on Quality Control by Artificial Vision
KEYWORDS: Content based image retrieval, Databases, Inspection, Feature extraction, Distance measurement, Image filtering, Image retrieval, Image classification, Prototyping, Information science

Proceedings Article | 5 October 2001
Proc. SPIE. 4572, Intelligent Robots and Computer Vision XX: Algorithms, Techniques, and Active Vision
KEYWORDS: Image processing algorithms and systems, Statistical analysis, Defect detection, Image segmentation, Error analysis, Inspection, Feature extraction, Distance measurement, Algorithm development, Statistical modeling

Proceedings Article | 11 October 2000
Proc. SPIE. 4197, Intelligent Robots and Computer Vision XIX: Algorithms, Techniques, and Active Vision
KEYWORDS: Image processing algorithms and systems, Statistical analysis, Defect detection, Detection and tracking algorithms, Image segmentation, Image processing, Inspection, Feature extraction, Stochastic processes, Binary data

Proceedings Article | 6 October 1998
Proc. SPIE. 3522, Intelligent Robots and Computer Vision XVII: Algorithms, Techniques, and Active Vision
KEYWORDS: Statistical analysis, Defect detection, Image segmentation, Error analysis, Ions, Feature extraction, Information technology, Image classification, Statistical methods, Prototyping

Showing 5 of 8 publications
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