Dr. Jules-Raymond Tapamo
at Univ of Kwazulu-Natal
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 3 May 2004
Proc. SPIE. 5303, Machine Vision Applications in Industrial Inspection XII
KEYWORDS: Microscopes, Image segmentation, Image processing, Particles, Crystals, Feature extraction, Image analysis, Image quality, Image enhancement, Binary data

Proceedings Article | 21 September 2001
Proc. SPIE. 4550, Image Extraction, Segmentation, and Recognition
KEYWORDS: Image compression, Visual process modeling, Image segmentation, Silicon, Hough transforms, Feature extraction, Image analysis, Picosecond phenomena, Optical character recognition, Osmium

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