Julia Hahn
at Technische Univ Darmstadt
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 25 April 2008
Proc. SPIE. 6995, Optical Micro- and Nanometrology in Microsystems Technology II
KEYWORDS: Refractive index, Lithium niobate, Waveguides, Sensors, Crystals, Interfaces, Coating, Near field scanning optical microscopy, Near field, Integrated optics

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