Ms. Juliane Ratteit
at Fraunhofer IOF
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | September 1, 2005
Proc. SPIE. 5878, Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies II
KEYWORDS: Mirrors, Multilayers, Scattering, Sensors, Interfaces, Light scattering, Atomic force microscopy, Scatter measurement, Optics manufacturing, Autoregressive models

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