The complex ac conductance G(ω0) of a system measures the dynamical response of the current to a small
voltage excitation at frequency ω0. It cannot in general be deduced from the only knowledge of the dc I(V )
characteristics. Similarly, we investigate the dynamical response of current noise to an ac excitation, i.e. the
in-phase and out-of-phase response of current noise density S(ω) measured at frequency ω. We present a detailed
calculation of this new response function χω0 (ω), that we name noise susceptibility, at arbitrary frequencies for
a coherent conductor in the scattering matrix formalism. We exemplify the relevance of our calculation by the
measurement of the noise susceptibility of a tunnel junction in the quantum regime &barh;ω ~ &barh;ω0> >kBT, which is
in remarkable agreement with our theory.
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