Julien Michelot
at Pyxalis
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 2 March 2020 Paper
Proc. SPIE. 11287, Photonic Instrumentation Engineering VII
KEYWORDS: Refractive index, Optical sensors, Imaging systems, Scattering, Sensors, Particles, Light scattering, Laser scattering, Photodiodes, Semiconducting wafers

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