Julien Miranda
at Lab d'Analyse et d'Architecture des Systèmes du CNRS
SPIE Involvement:
Author
Publications (2)

SPIE Journal Paper | 3 March 2020
JEI Vol. 29 Issue 04
KEYWORDS: Data modeling, Neural networks, Prototyping, Image classification, Unmanned aerial vehicles, Machine learning, Defect detection, Inspection, 3D modeling, Optical inspection

Proceedings Article | 16 July 2019 Paper
Proc. SPIE. 11172, Fourteenth International Conference on Quality Control by Artificial Vision
KEYWORDS: Data modeling, Machine learning, Statistical modeling, Image classification, Unmanned aerial vehicles, Optical inspection, Detection and tracking algorithms, Convolution, Defect detection, Inspection

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