Prof. Jun Ho Lee Profile

Prof. Jun Ho Lee

Professor at Kongju National Univ

SPIE Involvement:

Author

Publications (23)

Proceedings Article | 27 November 2023 Paper

Atmospheric turbulence profiling in Korea with SLODAR

J. Joo, H. Ha, S. Han, J. Lee, T. Butterley

Proceedings Volume 12767, 127670I (2023) https://doi.org/10.1117/12.2685354

KEYWORDS: Atmospheric optics, Atmospheric sensing, Binary stars, Wavefront sensors, Adaptive optics, Ranging, Prisms, Atmospheric turbulence, Profiling, Refractive index

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Proceedings Article | 27 November 2023 Paper

Reconstruction error analysis in LGS tomography for adaptive optics applications

S. Han, J. Joo, S. Ju, J. Lee, T. Butterley

Proceedings Volume 12767, 127670J (2023) https://doi.org/10.1117/12.2687115

KEYWORDS: Tomography, Error analysis, Adaptive optics, MATLAB, Reconstruction algorithms, Algorithm development, Turbulence, Reliability, Atmospheric turbulence

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Proceedings Article | 14 June 2023 Presentation + Paper

Wide-wide linear astigmatism free-three mirror system (LAF-TMS) enabling wide field-of-view and spectral bandwidth detection

Changgon Kim, Dohoon Kim, Jimin Han, Seunghyuk Chang, Woojin Park, Daewook Kim, Jun Ho Lee, John Peterson, Dae-Hee Lee, Soojong Pak

Proceedings Volume 12530, 125300A (2023) https://doi.org/10.1117/12.2663309

KEYWORDS: Design and modelling, Point spread functions, Unmanned aerial vehicles, Monochromatic aberrations, Mirrors, Tunable filters, Optical design, Image filtering, Atmospheric optics, UAV imaging systems

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Proceedings Article | 28 October 2022 Paper

Innovative volume-sharing multi-aperture payload for high resolution small satellites

Jun Ho Lee, Seok Gi Han, Do Hee Kim, Myoungjoo Kang, Sehyun Seong

Proceedings Volume 12264, 122640M (2022) https://doi.org/10.1117/12.2648163

KEYWORDS: Satellites, Sensors, Image sensors, Super resolution, Image resolution, Diffraction, Spatial resolution, Electro optical imaging, Cameras, Resolution enhancement technologies

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Proceedings Article | 22 February 2021 Presentation + Paper

Comparative near infrared through-focus scanning optical microscopy for 3D memory subsurface defect detection and classification

Jun Ho Lee, Seokjin Na, Junhee Jeong, Ralf Buengener

Proceedings Volume 11611, 116110T (2021) https://doi.org/10.1117/12.2576287

KEYWORDS: Defect detection, Optical microscopy, Near infrared, 3D modeling, 3D metrology, Data modeling, 3D acquisition, Wafer-level optics, Semiconductors

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Proceedings Article | 26 March 2019 Paper

Area-framing optical defect review under optical resolution using multi-NA dark-field microscopy images

Jun Ho Lee, Junhee Jeong, Chris Park, Shin-Woong Park, Hwi Kim, Byeong Geon You

Proceedings Volume 10959, 109592L (2019) https://doi.org/10.1117/12.2513838

KEYWORDS: Light scattering, Inspection, Semiconducting wafers, Scanning electron microscopy, Mie scattering, Point spread functions, Image resolution, Rayleigh scattering, Microscopy, Optical resolution

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Proceedings Article | 13 March 2018 Presentation + Paper

Through-focus scanning optical microscopy (TSOM) with adaptive optics

Jun Ho Lee, Gyunam Park, Junhee Jeong, Chris Park

Proceedings Volume 10585, 105850C (2018) https://doi.org/10.1117/12.2282527

KEYWORDS: Adaptive optics, Inspection, Mirrors, Wavefront sensors, Metrology, Sensors, Microscopy, Optical microscopy, Image processing, Semiconducting wafers

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Through-focus optical microscopy (TSOM) with nanometer-scale lateral and vertical sensitivity levels matching those of scanning electron microscopy has been demonstrated to be useful both for 3D inspections and metrology assessments. In 2014, funded by two private companies (Nextin/Samsung Electronics) and the Korea Evaluation Institute of Industrial Technology (KEIT), a research team from four universities in South Korea set out to investigate core technologies for developing in-line TSOM inspection and metrology tools, with the respective teams focusing on optics implementation, defect inspection, computer simulation and high-speed metrology matching. We initially confirmed the reported validity of the TSOM operation through a computer simulation, after which we implemented the TSOM operation by throughfocus scanning of existing UV (355nm) and IR (800nm) inspection tools. These tools have an identical sampling distance of 150 nm but have different resolving distances (310 and 810 nm, respectively). We initially experienced some improvement in the defect inspection sensitivity level over TSV (through-silicon via) samples with ~ 6.6 μm diameters. However, during the experiment, we noted sensitivity and instability issues when attempting to acquire TSOM images. As TSOM 3D information is indirectly extracted by differentiating a target TSOM image from reference TSOM images, any instability or mismatch in imaging conditions can result in measurement errors. As a remedy to such a situation, we proposed the application of adaptive optics to the TSOM operation and developed a closed-loop system with a tip/tilt mirror and a Shack-Hartmann sensor on an optical bench. We were able to keep the plane position within in RMS 0.4 pixel by actively compensating for any position instability which arose during the TSOM scanning process along the optical axis. Currently, we are also developing another TSOM tool with a deformable mirror instead of a tip/tilt mirror, in which case we will not require any mechanical scanning.

Proceedings Article | 5 September 2017 Paper

Simple alignment procedure for a VNIR imaging spectrometer with a Shack-Hartmann wavefront sensor and a field identifier

Jun Ho Lee, Sunglyoung Hwang, Dohwan Jeong, Jinsuk Hong, Youngsoo Kim, Yeonsoo Kim, Hyunsook Kim

Proceedings Volume 10402, 104020H (2017) https://doi.org/10.1117/12.2275404

KEYWORDS: Spectroscopy, Optical fabrication, Wavefront sensors, Sensors, Visible radiation, Relays, Mirrors, Optical alignment, Telescopes, Charge-coupled devices

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Proceedings Article | 24 November 2016 Paper

Tip/tilt-compensated through-focus scanning optical microscopy

Jun Ho Lee, Jun Hyung Park, Dohwan Jeong, Eun Ji Shin, Chris Park

Proceedings Volume 10023, 100230P (2016) https://doi.org/10.1117/12.2247807

KEYWORDS: Optical microscopy, Adaptive optics, Wafer-level optics, Wafer inspection, Wavefront sensors, Semiconducting wafers, Sensors, Optical benches, Mirrors, Image processing

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Proceedings Article | 31 October 2016 Paper

Development of an atmospheric turbulence simulator for deformable mirror evaluation

Jun Ho Lee, Sunmi Shin, Hyug-Gyo Rhee, Ho-Soon Yang, Ho-Jae Lee

Proceedings Volume 10020, 100200K (2016) https://doi.org/10.1117/12.2247814

KEYWORDS: Deformable mirrors, Atmospheric turbulence, Device simulation, Adaptive optics, Actuators, Silicon carbide, Telescopes, Turbulence, Stars, Computer simulations

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Proceedings Article | 25 October 2012 Paper

Analytical design of a hyper-spectral imaging spectrometer utilizing a convex grating

Seo Kim, Hong Kong, Hana Ku, Jun Lee

Proceedings Volume 8515, 85150V (2012) https://doi.org/10.1117/12.929485

KEYWORDS: Spectroscopy, Vignetting, Imaging systems, Optical design, Diffraction gratings, Monochromatic aberrations, Mirrors, Code v, Hyperspectral systems, Sensors

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Proceedings Article | 15 October 2012 Paper

Development of a computer-aided alignment simulator for an EO/IR dual-band airborne camera

Jun Ho Lee, Seungyeol Ryoo, Kwang-Woo Park, Haeng Bok Lee

Proceedings Volume 8417, 84170E (2012) https://doi.org/10.1117/12.2002562

KEYWORDS: Computer simulations, Modulation transfer functions, Error analysis, Device simulation, Zemax, Mirrors, Cameras, Sensors, MATLAB, Infrared imaging

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Proceedings Article | 15 October 2012 Paper

Optical design, performance, and tolerancing of an Offner imaging spectrograph

Hana Ku, Seo Hyun Kim, Hong Jin Kong, Jun Ho Lee

Proceedings Volume 8491, 84910K (2012) https://doi.org/10.1117/12.929483

KEYWORDS: Mirrors, Modulation transfer functions, Tolerancing, Spectrographs, Optical design, Spectroscopy, Spectral resolution, Off axis mirrors, Diffraction, Short wave infrared radiation

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Proceedings Article | 29 April 2009 Paper

Imaging and radiometric performance simulation for a new high-performance dual-band airborne reconnaissance camera

Sehyun Seong, Jinhee Yu, Dongok Ryu, Jinsuk Hong, Jee-Yeon Yoon, Sug-Whan Kim, Jun-Ho Lee, Myung-Jin Shin

Proceedings Volume 7307, 730705 (2009) https://doi.org/10.1117/12.818485

KEYWORDS: Cameras, Sensors, Modulation transfer functions, Visible radiation, Device simulation, Infrared imaging, Monte Carlo methods, Submerged target modeling, Infrared cameras, Performance modeling

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Proceedings Article | 11 December 2008 Paper

Prototype development of a compact imaging spectrometer (COMIS) for a microsatellite, STSAT3

Jun Ho Lee, Y. M. Kim, T. Jang, H. Yang, K. I. Kang, S. W. Rhee

Proceedings Volume 7149, 71490N (2008) https://doi.org/10.1117/12.802344

KEYWORDS: Electronics, Spectroscopy, Telescopes, Charge-coupled devices, Prototyping, Optics manufacturing, 3D modeling, Satellites, Modulation transfer functions, Spectral resolution

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Proceedings Article | 14 January 2008 Paper

Coupling of light from an LED into a very thin light guide by a coupling lens

Jun Ho Lee, W. Chang, D. Choi

Proceedings Volume 6828, 68280K (2008) https://doi.org/10.1117/12.747743

KEYWORDS: Light emitting diodes, Waveguides, Collimation, 3D modeling, Light, Geometrical optics, Light sources, Reflection, Optics manufacturing, Polymethylmethacrylate

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Proceedings Article | 28 November 2007 Paper

Simultaneous defect inspection on the surface and in the interior of bare wafers using a simple knife-edge test

Jun Ho Lee, Yongmin Kim, Jinseoub Kim, Yeong-eun Yoo

Proceedings Volume 6834, 683417 (2007) https://doi.org/10.1117/12.747730

KEYWORDS: Semiconducting wafers, Inspection, Microscopes, Visible radiation, Mirrors, Charge-coupled devices, Infrared imaging, Defect inspection, Wafer inspection, Wafer testing

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Proceedings Article | 17 October 2007 Paper

A compact imaging spectrometer (COMIS) for the microsatellite STSAT3

J. H. Lee, C. W. Lee, K. I. Kang, T. S. Jang, H. S. Yang, W. Han, J. O. Park, S. W. Rhee

Proceedings Volume 6744, 67441C (2007) https://doi.org/10.1117/12.747737

KEYWORDS: Satellites, Spectroscopy, Environmental monitoring, Hyperspectral imaging, Aerospace engineering, Imaging systems, Electronics, Aerosols, Standards development, Infrared imaging

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Proceedings Article | 8 June 2006 Paper

Investigation into the validity of Shack-Hartmann sensor for practical applications: intensity variations

J. Lee, U. Kang, Y. Lee, H. Cheon

Proceedings Volume 6018, 60180S (2006) https://doi.org/10.1117/12.669292

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SPIE Journal Paper | 1 May 2005

Lightweight mirror design method using topology optimization

Kang-Soo Park, Jun Ho Lee, Sung-Kie Youn

OE, Vol. 44, Issue 05, 053002, (May 2005) https://doi.org/10.1117/12.10.1117/1.1901685

KEYWORDS: Mirrors, Lightweight mirrors, Polishing, Optics manufacturing, Surface finishing, Objectives, Optimization (mathematics), Optical engineering, Manufacturing, 3D modeling

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Proceedings Article | 10 February 2005 Paper

An inflatable circular membrane mirror for space telescopes

Mingwan Soh, Jun Ho Lee, Sung-Kie Youn

Proceedings Volume 5638, (2005) https://doi.org/10.1117/12.571628

KEYWORDS: Mirrors, Space telescopes, Wavefronts, Actuators, Aspheric lenses, Space mirrors, Telescopes, Optimization (mathematics), Atmospheric optics, Adaptive optics

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Proceedings Article | 23 December 2004 Paper

Study of a circular bimorph deformable mirror for circular/annulus/square laser beam compensation

Jun Ho Lee, H. Gho, J. Hyu, Y. Lee, E. Kang, S. Kim, S. Lee

Proceedings Volume 5639, (2004) https://doi.org/10.1117/12.571609

KEYWORDS: Mirrors, Adaptive optics, Actuators, Monochromatic aberrations, Deformable mirrors, Finite element methods, Wavefronts, Control systems, Zernike polynomials, Defense technologies

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Proceedings Article | 23 December 2004 Paper

Increase of dynamic range of a Shack-Hartmann sensor by shifting detector plane

Weon-Woong Lee, Jun Ho Lee, Chang Kwon Hwangbo

Proceedings Volume 5639, (2004) https://doi.org/10.1117/12.571615

KEYWORDS: Wavefront sensors, Sensors, Wavefronts, Charge-coupled devices, Monochromatic aberrations, CCD image sensors, Image sensors, Computer simulations, Microlens array, Microlens

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Showing 5 of 23 publications

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