Prof. Jun Ho Lee
Professor at Kongju National Univ
SPIE Involvement:
Author
Publications (17)

PROCEEDINGS ARTICLE | March 13, 2018
Proc. SPIE. 10585, Metrology, Inspection, and Process Control for Microlithography XXXII
KEYWORDS: Mirrors, Metrology, Sensors, Image processing, Microscopy, Optical microscopy, Inspection, Wavefront sensors, Adaptive optics, Semiconducting wafers

PROCEEDINGS ARTICLE | September 5, 2017
Proc. SPIE. 10402, Earth Observing Systems XXII
KEYWORDS: Telescopes, Mirrors, Visible radiation, Sensors, Spectroscopy, Wavefront sensors, Optical fabrication, Relays, Charge-coupled devices, Optical alignment

PROCEEDINGS ARTICLE | November 24, 2016
Proc. SPIE. 10023, Optical Metrology and Inspection for Industrial Applications IV
KEYWORDS: Wafer-level optics, Mirrors, Sensors, Image processing, Optical microscopy, Wavefront sensors, Adaptive optics, Wafer inspection, Optical benches, Semiconducting wafers

PROCEEDINGS ARTICLE | October 31, 2016
Proc. SPIE. 10020, Optoelectronic Imaging and Multimedia Technology IV
KEYWORDS: Actuators, Telescopes, Stars, Adaptive optics, Deformable mirrors, Computer simulations, Turbulence, Silicon carbide, Atmospheric turbulence, Device simulation

PROCEEDINGS ARTICLE | October 25, 2012
Proc. SPIE. 8515, Imaging Spectrometry XVII
KEYWORDS: Monochromatic aberrations, Mirrors, Optical design, Imaging systems, Sensors, Spectroscopy, Hyperspectral systems, Vignetting, Code v, Diffraction gratings

PROCEEDINGS ARTICLE | October 15, 2012
Proc. SPIE. 8417, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
KEYWORDS: Infrared imaging, Zemax, Mirrors, MATLAB, Cameras, Sensors, Error analysis, Computer simulations, Modulation transfer functions, Device simulation

Showing 5 of 17 publications
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