Dr. Jun He Profile

Dr. Jun He

Noth electric science group

SPIE Involvement:

Author

Publications (1)

This will count as one of your downloads.

You will have access to both the presentation and article (if available).

DOWNLOAD NOW

This content is available for download via your institution's subscription. To access this item, please sign in to your personal account.

Email or Username Forgot your username?

Password Forgot your password?

Show

Keep me signed in

No SPIE account? Create an account

Proceedings Article | 1 December 2009 Paper

The measurement of refractive index homogeneity of the large diameter Ge plate using interferometry

Jun He, Lei Chen

Proceedings Volume 7506, 750623 (2009) https://doi.org/10.1117/12.838104

KEYWORDS: Germanium, Refractive index, Infrared radiation, Interferometers, Infrared materials, Wavefronts, Thermography, Phase shifts, Infrared lenses, Spherical lenses

Read Abstract +

The method is presented to measure the homogeneity of the refractive index of infrared optical material, germanium (Ge) plate, using infrared interferometer working at 10.6μm. In order to measure the refractive index homogeneity of large diameter infrared material, the infrared standard lens is used in the test arm of infrared interferometer. The Ge plate is placed in the infrared spherical wave brought by infrared standard lens. The difference is measured between the wavefront with Ge plate and the one without Ge plate by the infrared interferometer working at 10.6μm. The addition aberration caused by Ge plate needs to be eliminated with Zernike polynomials fit from the results. As the Ge plate is too soft to process, its surface form may not meet the requirement for the measurement. In order to improve the measuring accuracy of the refractive index homogeneity, the surface deformations of two boundaries of the Ge plate are measured by phase-shifting digital interferometer working at 0.6328μm. The surface deformations are removed from the result of the refractive index homogeneity measurement. In this way, the measuring accuracy of the refractive index homogeneity is up to 10^-5. A piece of Ge plate is tested. The peak-valley (PV) value of its refractive index deviation is 3.65×10^-5, and the root mean square (RMS) value is 4.11×10^-6.

My Library

You currently do not have any folders to save your paper to! Create a new folder below.

Folder Name

Folder Description

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks. You are receiving this notice because your organization may not have SPIE eBooks access.*

*Shibboleth/Open Athens users─please sign in to access your institution's subscriptions.

To obtain this item, you may purchase the complete book in print or electronic format on SPIE.org.

ORGANIZATIONAL
Sign in with credentials provided by your organization.

Organizational Username

Organizational Password

Show/Hide Password

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members:

Non-members: ADD TO CART

Keywords/Phrases

Search In:

Publication Years