Dr. Jun Jiang
at Shenzhen Institutes of Advanced Technology
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | December 24, 2013
Proc. SPIE. 9067, Sixth International Conference on Machine Vision (ICMV 2013)
KEYWORDS: Light emitting diodes, Defect detection, Reflection, Cameras, Manufacturing, Inspection, Computing systems, Image acquisition, Light sources and illumination, Machine vision

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