Dr. Jun Jiang
at Shenzhen Institutes of Advanced Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 24 December 2013 Paper
Baowen Chen, Jun Jiang, Jun Cheng, Sanming Shen
Proceedings Volume 9067, 906708 (2013) https://doi.org/10.1117/12.2049795
KEYWORDS: Defect detection, Light sources and illumination, Inspection, Cameras, Computing systems, Machine vision, Manufacturing, Light emitting diodes, Image acquisition, Reflection

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