Jun Xiong
at Chongqing Institute of Metrology and Quality Inspection
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 6 May 2019
Proc. SPIE. 11069, Tenth International Conference on Graphics and Image Processing (ICGIP 2018)
KEYWORDS: Metrology, Calibration, Scanners, Error analysis, Optical testing, Optical scanning, Distance measurement, Spherical lenses, Optical calibration

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