Prof. Jun Zhao
at China Jiliang Univ
SPIE Involvement:
Author
Publications (9)

PROCEEDINGS ARTICLE | August 23, 2017
Proc. SPIE. 10373, Applied Optical Metrology II
KEYWORDS: Glasses, Wavefronts, Deflectometry, Ray tracing, Testing and analysis

PROCEEDINGS ARTICLE | August 23, 2017
Proc. SPIE. 10373, Applied Optical Metrology II
KEYWORDS: Calibration, Deflectometry, Ray tracing, Reverse modeling

PROCEEDINGS ARTICLE | June 26, 2017
Proc. SPIE. 10329, Optical Measurement Systems for Industrial Inspection X
KEYWORDS: 3D acquisition, Interferometers, Wavefronts, 3D modeling, Particle swarm optimization, Reconstruction algorithms

PROCEEDINGS ARTICLE | January 26, 2016
Proc. SPIE. 9903, Seventh International Symposium on Precision Mechanical Measurements
KEYWORDS: Imaging systems, Cameras, Calibration, Image acquisition, Image resolution, Distortion, Precision measurement, Machine vision, Coded apertures, Panoramic photography

PROCEEDINGS ARTICLE | March 6, 2015
Proc. SPIE. 9446, Ninth International Symposium on Precision Engineering Measurement and Instrumentation
KEYWORDS: Metrology, Optical spheres, Sensors, Calibration, Error analysis, Computing systems, Distance measurement, 3D metrology, Computed tomography, Absorption

PROCEEDINGS ARTICLE | March 6, 2015
Proc. SPIE. 9446, Ninth International Symposium on Precision Engineering Measurement and Instrumentation
KEYWORDS: Optical filters, Modulation, Wavelets, Interference (communication), Computer simulations, Signal processing, Electronic filtering, Electrophoretic light scattering, Evolutionary algorithms, Bandpass filters

Showing 5 of 9 publications
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Back to Top