Prof. Jun Zhao
at China Jiliang Univ
SPIE Involvement:
Author
Publications (9)

PROCEEDINGS ARTICLE | August 23, 2017
Proc. SPIE. 10373, Applied Optical Metrology II
KEYWORDS: Ray tracing, Wavefronts, Testing and analysis, Glasses, Deflectometry

PROCEEDINGS ARTICLE | August 23, 2017
Proc. SPIE. 10373, Applied Optical Metrology II
KEYWORDS: Calibration, Deflectometry, Ray tracing, Reverse modeling

PROCEEDINGS ARTICLE | June 26, 2017
Proc. SPIE. 10329, Optical Measurement Systems for Industrial Inspection X
KEYWORDS: Particle swarm optimization, 3D modeling, Wavefronts, Reconstruction algorithms, Interferometers, 3D acquisition

PROCEEDINGS ARTICLE | January 26, 2016
Proc. SPIE. 9903, Seventh International Symposium on Precision Mechanical Measurements
KEYWORDS: Cameras, Calibration, Imaging systems, Distortion, Precision measurement, Machine vision, Panoramic photography, Coded apertures, Image resolution, Image acquisition

PROCEEDINGS ARTICLE | March 6, 2015
Proc. SPIE. 9446, Ninth International Symposium on Precision Engineering Measurement and Instrumentation
KEYWORDS: Error analysis, Optical spheres, Calibration, Metrology, Sensors, Distance measurement, Absorption, Computing systems, Computed tomography, 3D metrology

PROCEEDINGS ARTICLE | March 6, 2015
Proc. SPIE. 9446, Ninth International Symposium on Precision Engineering Measurement and Instrumentation
KEYWORDS: Wavelets, Signal processing, Interference (communication), Computer simulations, Bandpass filters, Evolutionary algorithms, Electrophoretic light scattering, Modulation, Optical filters, Electronic filtering

Showing 5 of 9 publications
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