Dr. Junfeng Liu
at
SPIE Involvement:
Author
Publications (2)

PROCEEDINGS ARTICLE | October 24, 2017
Proc. SPIE. 10458, AOPC 2017: 3D Measurement Technology for Intelligent Manufacturing

PROCEEDINGS ARTICLE | June 26, 2017
Proc. SPIE. 10330, Modeling Aspects in Optical Metrology VI
KEYWORDS: Modeling, Prisms, Interferometers, Sensors, Calibration, Error analysis, Optical testing, Optical metrology, Distance measurement, Profilometers, Defense technologies, Motion measurement, Systems modeling, Standards development

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