Mr. Jung-Tsung Chou
Associate Engineer at Industrial Technology Research Institute
SPIE Involvement:
Author
Publications (5)

PROCEEDINGS ARTICLE | August 31, 2005
Proc. SPIE. 5878, Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies II
KEYWORDS: Microelectromechanical systems, Light sources, Ferroelectric materials, Light emitting diodes, Silicon, Interferometry, Control systems, Atomic force microscopy, 3D metrology, Light

PROCEEDINGS ARTICLE | August 18, 2005
Proc. SPIE. 5879, Recent Developments in Traceable Dimensional Measurements III
KEYWORDS: Refractive index, Fabry–Perot interferometers, Ferroelectric materials, Fabry–Perot interferometry, Sensors, Atomic force microscopy, Head, Signal processing, Laser Doppler velocimetry, Liquids

PROCEEDINGS ARTICLE | April 12, 2005
Proc. SPIE. 5852, Third International Conference on Experimental Mechanics and Third Conference of the Asian Committee on Experimental Mechanics
KEYWORDS: Actuators, Microscopes, Mirrors, Ferroelectric materials, Fiber optics, Sensors, Interferometry, Fiber optics sensors, 3D image processing, Channel projecting optics

PROCEEDINGS ARTICLE | August 2, 2004
Proc. SPIE. 5532, Interferometry XII: Applications
KEYWORDS: Lithium, Lasers, Interferometers, Sensors, Calibration, Control systems, Temperature sensors, Sensing systems, Laser based displays, Standards development

PROCEEDINGS ARTICLE | August 2, 2004
Proc. SPIE. 5531, Interferometry XII: Techniques and Analysis
KEYWORDS: Actuators, Optical fibers, Ferroelectric materials, Fiber optics, Interferometers, Sensors, Calibration, Electrodes, Fiber optics sensors, Signal detection

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