Dr. Jung-Yeol Yeom
Senoir Research Engineer at LG Electronics Inc
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 17 November 2008
Proc. SPIE. 7266, Optomechatronic Technologies 2008
KEYWORDS: X-rays, Sensors, Microchannel plates, X-ray imaging, Inspection, Spatial resolution, Image sensors, Defect detection, Particles, Microscopes

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