Dr. Jung-Yeol Yeom
Senoir Research Engineer at LG Electronics Inc
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | November 17, 2008
Proc. SPIE. 7266, Optomechatronic Technologies 2008
KEYWORDS: Microscopes, Defect detection, Sensors, Particles, Microchannel plates, X-rays, Inspection, Image sensors, Spatial resolution, X-ray imaging

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