Dr. Junguo Pang
at AIST
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 28 February 2005 Paper
Junguo Pang, Takehiko Segawa, Tsuyoshi Ikehara, Hiro Yoshida, Yoshihiro Kikushima, Hiroyuki Abe, Ryutaro Meada
Proceedings Volume 5649, (2005) https://doi.org/10.1117/12.582250
KEYWORDS: Sensors, Calibration, Temperature metrology, Velocity measurements, Semiconducting wafers, Skin, Control systems, Wheatstone bridges, Amplifiers, Microelectromechanical systems

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