Prof. Jungwon Kim
Professor of Mechanical Engineering/Adjunct Professor of Electrical Engineering at KAIST
SPIE Involvement:
Conference Program Committee | Author
Area of Expertise:
optical frequency combs , microwave photonics , timing and synchronization , ultrafast optics , optical metrology , ultrafast dynamic imaging
Profile Summary

Jungwon Kim received the B.S. degree in electrical engineering from Seoul National University in 1999, and the S.M. and Ph.D. degrees in electrical engineering and computer science from MIT in 2004 and 2007, respectively. In 2009, he joined the faculty of the Korea Advanced Institute of Science and Technology (KAIST), where he is currently a professor of mechanical engineering and adjunct professor of electrical engineering. His research interests are optical frequency combs and their applications in microwave/mm-wave photonics, ultrafast 3D imaging, photonic signal processing, and industrial metrology. Dr. Kim is a Fellow of Optica (formerly OSA) and a Senior Member of IEEE, and is a Topical Editor of Optics Letters.
Publications (14)

Proceedings Article | 13 March 2024 Presentation
Igju Jeon, Changmin Ahn, Jungwon Kim
Proceedings Volume PC12912, PC129121M (2024)
KEYWORDS: Laser stabilization, Laser optics, Optical fibers, Vibration, Continuous wave operation, Fiber lasers, Laser frequency, Frequency combs, Thermography, Spectroscopy

Proceedings Article | 12 March 2024 Presentation
Changmin Ahn, Igju Jeon, Daewon Suk, Hansuek Lee, Jungwon Kim
Proceedings Volume PC12885, PC128850H (2024)
KEYWORDS: Mode locking, Laser stabilization, Microwave radiation, Laser frequency, Quantum frequencies, Beam divergence, Quantum noise, Microwave photonics, Spectroscopy, Quantum fields

Proceedings Article | 12 March 2024 Presentation
Minji Hyun, Hayun Chung, Woongdae Na, Jungwon Kim
Proceedings Volume PC12892, PC1289202 (2024)
KEYWORDS: Clocks, Pulse signals, Femtosecond pulse shaping, Ultrafast phenomena, Photocurrent, Laser optics, Integrated circuits, Frequency combs, Beam divergence, Thermography

Proceedings Article | 10 August 2023 Poster
Proceedings Volume 12618, 1261827 (2023)
KEYWORDS: Temperature metrology, Reflectivity, Calibration, Ultrafast phenomena, Silicon, Semiconducting wafers, Temporal resolution, Wafer-level optics, Reflection, Optical surfaces

Proceedings Article | 20 June 2021 Presentation + Paper
Hyunsoo Kwak, Sungyoon Ryu, Suil Cho, Junmo Kim, Yusin Yang, Jungwon Kim
Proceedings Volume 11782, 117820U (2021)
KEYWORDS: Machine learning, Data modeling, Transmission electron microscopy, Statistical modeling, Semiconductors, Optical metrology, 3D metrology, Target detection, Ultrafast phenomena, Spectroscopic ellipsometry

Showing 5 of 14 publications
Conference Committee Involvement (4)
Real-time Photonic Measurements, Data Management, and Processing VIII
12 October 2024 | Nantong, Jiangsu, China
Real-time Photonic Measurements, Data Management, and Processing VII
16 October 2023 | Beijing, China
Real-time Photonic Measurements, Data Management, and Processing VI
10 October 2021 | Nantong, JS, China
Real-time Photonic Measurements, Data Management, and Processing V
12 October 2020 | Online Only, China
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