Dr. Junjie Wu
at Shanghai Jiao Tong Univ.
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 31 August 2017
Proc. SPIE. 10354, Nanoengineering: Fabrication, Properties, Optics, and Devices XIV
KEYWORDS: Microscopes, Optical microscopes, Metrology, Interferometers, Calibration, Silicon, Fourier transforms, Optical resolution, Atomic force microscope

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