Dr. Junpeng Xue
at Brookhaven National Lab
SPIE Involvement:
Author
Publications (5)

PROCEEDINGS ARTICLE | August 23, 2017
Proc. SPIE. 10388, Advances in Computational Methods for X-Ray Optics IV
KEYWORDS: Metrology, Mirrors, Optical alignment, Wavefront sensors, Device simulation, Synchrotrons, X-rays, Synchrotron radiation, Wavefront aberrations, In situ metrology

PROCEEDINGS ARTICLE | June 13, 2017
Proc. SPIE. 10449, Fifth International Conference on Optical and Photonics Engineering
KEYWORDS: Deflectometry, 3D metrology, Phase measurement, Mathematical modeling, Optical metrology, Ray tracing, 3D modeling, Nonlinear optics, Cameras, 3D acquisition

PROCEEDINGS ARTICLE | September 8, 2016
Proc. SPIE. 9965, Adaptive X-Ray Optics IV
KEYWORDS: X-rays, Actuators, Deformable mirrors, Metrology, Standards development, Mirrors, Mirrors, Inspection, Time metrology, X-ray optics, Adaptive optics

PROCEEDINGS ARTICLE | March 4, 2015
Proc. SPIE. 9302, International Conference on Experimental Mechanics 2014
KEYWORDS: Speckle, 3D metrology, Cameras, Projection systems, 3D image processing, Modulation, 3D modeling, 3D acquisition, Speckle pattern, Calibration

PROCEEDINGS ARTICLE | June 2, 2014
Proc. SPIE. 9234, International Conference on Experimental Mechanics 2013 and Twelfth Asian Conference on Experimental Mechanics
KEYWORDS: Speckle, Calibration, Cameras, 3D metrology, Imaging systems, Clouds, Digital photography, Projection systems, 3D image processing, Fringe analysis

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