Mr. Junrui Li
at Oakland Univ
SPIE Involvement:
Author
Publications (5)

SPIE Journal Paper | June 15, 2017
OE Vol. 56 Issue 06
KEYWORDS: Speckle pattern, Interferometry, Imaging systems, System integration, Cameras, Speckle, Interferometers, Aluminum

SPIE Journal Paper | April 1, 2016
OE Vol. 55 Issue 09
KEYWORDS: Cameras, Speckle pattern, Interferometry, Digital image correlation, 3D metrology, Imaging systems, CCD cameras, Fourier transforms, CCD image sensors, Holograms

PROCEEDINGS ARTICLE | January 26, 2016
Proc. SPIE. 9903, Seventh International Symposium on Precision Mechanical Measurements
KEYWORDS: Safety, Speckle, Cameras, Calibration, Image processing, In situ metrology, CCD cameras, Digital image correlation, Mechanical engineering, Strain analysis

PROCEEDINGS ARTICLE | October 10, 2013
Proc. SPIE. 8916, Sixth International Symposium on Precision Mechanical Measurements
KEYWORDS: Phase shifting, Holograms, Spatial frequencies, Digital filtering, Fourier transforms, Interferometry, Speckle pattern, Charge-coupled devices, CCD image sensors, Phase shifts

PROCEEDINGS ARTICLE | January 31, 2013
Proc. SPIE. 8759, Eighth International Symposium on Precision Engineering Measurement and Instrumentation
KEYWORDS: Optical filters, Fringe analysis, Phase shifting, Speckle, Digital filtering, Interferometry, Linear filtering, Speckle pattern, Image filtering, Nonlinear filtering

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