Dr. Jürgen Petter
Business Director at Ametek GmbH
SPIE Involvement:
Author
Publications (6)

PROCEEDINGS ARTICLE | October 11, 2015
Proc. SPIE. 9633, Optifab 2015
KEYWORDS: Monochromatic aberrations, Metrology, Interferometers, Sensors, Error analysis, Optical testing, Distance measurement, Aspheric optics, 3D metrology, Aspheric lenses

PROCEEDINGS ARTICLE | October 15, 2013
Proc. SPIE. 8884, Optifab 2013
KEYWORDS: Metrology, Lenses, Interferometers, Interferometry, Optical testing, Time metrology, Distance measurement, 3D metrology, Aspheric lenses, Signal detection

PROCEEDINGS ARTICLE | May 13, 2013
Proc. SPIE. 8788, Optical Measurement Systems for Industrial Inspection VIII
KEYWORDS: Metrology, Axicons, Lenses, Interferometers, Sensors, Interferometry, Profiling, Distance measurement, Aspheric lenses, Surface finishing

PROCEEDINGS ARTICLE | April 25, 2008
Proc. SPIE. 6995, Optical Micro- and Nanometrology in Microsystems Technology II
KEYWORDS: Refractive index, Lithium niobate, Waveguides, Sensors, Crystals, Interfaces, Coating, Near field scanning optical microscopy, Near field, Integrated optics

PROCEEDINGS ARTICLE | November 19, 2003
Proc. SPIE. 4829, 19th Congress of the International Commission for Optics: Optics for the Quality of Life
KEYWORDS: Refractive index, Modulation, Waveguides, Crystals, Solitons, Photonic crystals, Photonics, Laser crystals, Laser beam diagnostics, Spatial solitons

PROCEEDINGS ARTICLE | September 3, 2003
Proc. SPIE. 5135, Optical Information, Data Processing and Storage, and Laser Communication Technologies
KEYWORDS: Optical filters, Refractive index, Holograms, Holography, Switching, Fiber Bragg gratings, Crystals, Wavelength division multiplexing, Tunable filters, Electro optics

Showing 5 of 6 publications
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