Dr. Kyung Hun Yoon
at SAMSUNG Electronics Co Ltd
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 9 March 2017 Paper
Seungman Yun, Jaehyuk Kim, Yoonsuk Huh, Jungha Kim, Sujin Park, Jungmin Kim, Jongpil Kim, Kyung Hun Yoon, JaeMoon Jo
Proceedings Volume 10132, 101323B (2017) https://doi.org/10.1117/12.2254271
KEYWORDS: Sensors, Radiography, Signal to noise ratio, Monte Carlo methods, Photon counting, Carbon nanotubes, Modulation transfer functions, X-rays, Digital photography, Modulation, Image sensors, X-ray detectors

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