Dr. Kai-Ping Chuang
at Industrial Technology Research Institute
SPIE Involvement:
Publications (4)

Proceedings Article | 16 November 2011
Proc. SPIE. 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation
KEYWORDS: Optical filters, Spectrographs, Light emitting diodes, Optical properties, Imaging systems, Spectroscopy, Optical testing, LED backlight, Spectral resolution, Semiconducting wafers

Proceedings Article | 10 September 2009
Proc. SPIE. 7432, Optical Inspection and Metrology for Non-Optics Industries
KEYWORDS: Hyperspectral imaging, Refractive index, Spectrographs, Data modeling, Polarization, Imaging systems, Polarizers, LCDs, Collimation, Liquid crystals

Proceedings Article | 27 November 2007
Proc. SPIE. 6723, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
KEYWORDS: Thin films, Ellipsometry, Refractive index, Reflection, Silicon, Inspection, Imaging spectroscopy, Polarizers, Optical testing, Range imaging

Proceedings Article | 1 September 2006
Proc. SPIE. 6302, Imaging Spectrometry XI
KEYWORDS: Monochromatic aberrations, Point spread functions, Spectrographs, Optical design, Imaging systems, Lens design, Optical fabrication, Colorimetry, Charge-coupled devices, Spatial resolution

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