Dr. Kai Pan
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 24 January 2019
Proc. SPIE. 11052, Third International Conference on Photonics and Optical Engineering
KEYWORDS: X-ray computed tomography, CT reconstruction, Sensors, X-rays, Image analysis, Image quality, Digital imaging, Computed tomography, Reconstruction algorithms, X-ray imaging

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