Dr. Kai Starke
at Cutting Edge Coatings GmbH
SPIE Involvement:
Author
Publications (38)

PROCEEDINGS ARTICLE | December 2, 2010
Proc. SPIE. 7842, Laser-Induced Damage in Optical Materials: 2010
KEYWORDS: Oxides, Optical components, Silica, Dielectrics, Electrons, Coating, Ion beams, Ionization, Temperature metrology, Absorption

PROCEEDINGS ARTICLE | December 31, 2009
Proc. SPIE. 7504, Laser-Induced Damage in Optical Materials: 2009
KEYWORDS: Femtosecond phenomena, Data modeling, Titanium dioxide, Silica, Laser induced damage, Dielectrics, Solids, Ionization, Laser damage threshold, Absorption

PROCEEDINGS ARTICLE | December 31, 2009
Proc. SPIE. 7504, Laser-Induced Damage in Optical Materials: 2009
KEYWORDS: Oxides, Gradient-index optics, Refractive index, Mirrors, Silica, Optical coatings, Ion beams, Transmittance, Thin film coatings, Absorption

PROCEEDINGS ARTICLE | December 31, 2009
Proc. SPIE. 7504, Laser-Induced Damage in Optical Materials: 2009
KEYWORDS: Oxides, Femtosecond phenomena, Laser induced damage, Dielectrics, Electrons, Ionization, Laser damage threshold, Picosecond phenomena, Pulsed laser operation, Absorption

PROCEEDINGS ARTICLE | May 14, 2008
Proc. SPIE. 7005, High-Power Laser Ablation VII
KEYWORDS: Oxides, Refractive index, Femtosecond phenomena, Laser induced damage, Composites, Coating, Ion beams, Laser damage threshold, Dielectric breakdown, Absorption

PROCEEDINGS ARTICLE | April 16, 2008
Proc. SPIE. 6922, Metrology, Inspection, and Process Control for Microlithography XXII
KEYWORDS: Optical lithography, Spectroscopy, Inspection, Reflectivity, Process control, Extreme ultraviolet, Charge-coupled devices, Geometrical optics, Spectrophotometry, EUV optics

Showing 5 of 38 publications
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