Kamal K. Pant
Research Scholar at IRDE
SPIE Involvement:
Author
Publications (7)

Proceedings Article | 21 June 2019
Proc. SPIE. 11056, Optical Measurement Systems for Industrial Inspection XI
KEYWORDS: Optical design, Metrology, Sensors, Error analysis, Wavefront sensors, Wavefronts, Collimation, Spatial resolution, Algorithm development, Freeform optics

Proceedings Article | 21 June 2019
Proc. SPIE. 11056, Optical Measurement Systems for Industrial Inspection XI
KEYWORDS: Optical components, Diamond turning, Metrology, Error analysis, Optical alignment, Freeform optics, Optics manufacturing

Proceedings Article | 21 June 2019
Proc. SPIE. 11057, Modeling Aspects in Optical Metrology VII
KEYWORDS: Zemax, Photovoltaics, Sensors, Error analysis, Wavefront sensors, Wavefronts, Collimation, Ray tracing, Wavefront reconstruction, Spherical lenses

Proceedings Article | 21 June 2019
Proc. SPIE. 11057, Modeling Aspects in Optical Metrology VII
KEYWORDS: Photovoltaics, Metrology, Sensors, Error analysis, Manufacturing, Wavefronts, Image registration, Phase measurement, Freeform optics, Data integration

SPIE Journal Paper | 22 August 2017
OE Vol. 56 Issue 08
KEYWORDS: Wavefronts, Photovoltaics, Sensors, Aspheric lenses, Diffractive optical elements, Freeform optics, Interferometry, Optical engineering, Metrology, Error analysis

Showing 5 of 7 publications
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top