The paper describes a new design of the classical variable wavelength interferometer that uses a continuously tuned light source. In the presented solution there is no need to sequentially record the images. The fringe field analysis is based on a single image. It can be implemented in either transmitted or reflected-light modes. In this paper we demonstrate its usefulness in measuring optical elements like retarders. The key element of novelty consists in the fast analysis of the single interferogram, which enables the instrument to be used in an industrial environment.
The paper concentrates on the micro-interferometric techniques that utilize a light source of the continuously tuned wavelength. The technique is called, after the light source, the variable wavelength interferometry. It can be implemented in transmitted or reflected-light modes and is useful in testing fibers, micro-structures and optical elements like retarders (wave plates). The emitted spectrum has to be continuous. When the measurement procedure advances the selected wavelength must be determined with high accuracy, which ultimately defines uncertainty of the optical path difference to be measured. The continuous character of the light source is the linking element with previously published Part I of the paper that focused on confocal sensors.
The paper describes a mobile application to be used in a chemical analytical laboratory. The program running under the control of Android operating system allows for preview of measurements recorded by the emission spectrometer. Another part of the application monitors operational and configuration parameters of the device in real time. The first part of this paper includes an overview of the atomic spectrometry. The second part contains a description of the application and its further potential development direction.
The phenomenon of laser light scattering provides the technology for visualization and testing the inner structure and homogeneity of materials. Some of them excited by the laser light in the tomographic process can emit light the wavelength of which is different than that of excitation laser. Such photoluminescence can be a source of additional information of the material’s structure. Combining the Laser Scattering Tomography (LST) and Spectrometry techniques has enabled us to develop a new type of an LST technique. The system is useful for investigations of various materials like semiconductors (Si, GaAs) ceramics, crystals for passive absorbers for high power pulse lasers, and laser crystals.