Kamyar Faron
VP Product Dev at Blue Control Technologies
SPIE Involvement:
Author
Publications (2)

PROCEEDINGS ARTICLE | May 17, 2005
Proc. SPIE. 5755, Data Analysis and Modeling for Process Control II
KEYWORDS: Semiconductors, Human-machine interfaces, Logic, Manufacturing, Reliability, Control systems, Process control, Semiconductor manufacturing, Algorithm development, Computer architecture

PROCEEDINGS ARTICLE | April 29, 2004
Proc. SPIE. 5378, Data Analysis and Modeling for Process Control
KEYWORDS: Semiconductors, Diffractive optical elements, Data modeling, Etching, Control systems, Process control, Semiconductor manufacturing, Critical dimension metrology, Semiconducting wafers, Process modeling

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Back to Top