Karl U. Vielhaber
at Fraunhofer-Institut für Produktionstechnologie IPT
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 14 May 2010
Proc. SPIE. 7718, Optical Micro- and Nanometrology III
KEYWORDS: Optical spheres, Sensors, Error analysis, Manufacturing, Kinematics, Deflectometry, Aspheric lenses, Reconstruction algorithms, Spherical lenses, Optics manufacturing

Proceedings Article | 18 June 2007
Proc. SPIE. 6616, Optical Measurement Systems for Industrial Inspection V
KEYWORDS: Titanium, Sensors, Metals, Image processing, Laser processing, Laser applications, Image analysis, CCD cameras, Image sensors, Laser optics

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